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Frequency: Quarterly
ISSN: 1941-7020 (Print)
ISSN: 1941-7039 (Online)
Research Article Open Access

New Development Design of Low Current Measurement with Noise Reduction for High-Resolution System

Ndalla Essengue Gloire1, Wembe Tafo Evariste2, Djamet Yimga Arnaud1, Folla Kamdem Jérôme1 and Essimbi Zobo Bernard1
  • 1 University of Yaoundé I, Cameroon
  • 2 University of Douala, Cameroon

Abstract

The treatment of inoperable cancers in the therapy terminal in Lanzhou-China, which is located at the Institute of Modern Physics (IMP), permits to work on the actual front-end readout. The availability of detailed noise spectral density characteristics for the OPA amplifier helps to develop the noise error analysis for high-resolution. This work focused on the noise model of the detector-preamplifier, which presents the low noise circuit schematic of the Transimpedance (TIA). Considering the parasitical influences, we develop a new approach to detect the weak signals based on resonant frequency, 1/√L1 (C1+CGS). In addition, the system eliminates leakage current in the reset switch and reduces the charge injection occur from the switches in the Gated Integrator (GI) and the configuration switch is made especially with two transmission gates switches, in series, with a grounded MOS switch, attached to the node between the two transmission gates switches and the linearity almost good.

American Journal of Engineering and Applied Sciences
Volume 11 No. 2, 2018, 756-765

DOI: https://doi.org/10.3844/ajeassp.2018.756.765

Submitted On: 13 April 2018 Published On: 18 May 2018

How to Cite: Gloire, N. E., Evariste, W. T., Arnaud, D. Y., Jérôme, F. K. & Bernard, E. Z. (2018). New Development Design of Low Current Measurement with Noise Reduction for High-Resolution System. American Journal of Engineering and Applied Sciences, 11(2), 756-765. https://doi.org/10.3844/ajeassp.2018.756.765

Open AccessCopyright: © 2018 Ndalla Essengue Gloire, Wembe Tafo Evariste, Djamet Yimga Arnaud, Folla Kamdem Jérôme and Essimbi Zobo Bernard. This is an open access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.

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Keywords

  • Photodiode
  • Transimpedance
  • Noise
  • Charge Injection Leakage Current
  • Transmission Gates